Semiconductor package for wafer level packaging and manufacturing method thereof

ABSTRACT

A semiconductor package includes a semiconductor die and a connection structure. The semiconductor die is laterally encapsulated by an insulating encapsulant. The connection structure is disposed on the semiconductor die, the connection structure is electrically connected to the semiconductor die, and the connection structure includes at least one first via, first pad structures, second vias, a second pad structure and a conductive terminal. The at least one first via is disposed over and electrically connected to the semiconductor die. The first pad structures are disposed over the at least one first via, wherein the at least one first via contacts at least one of the first pad structures. The second vias are disposed over the first pad structures, wherein the second vias contact the first pad structures. The second pad structure is disposed over and contacts the second vias, wherein a vertical projection of each of first pad structures overlaps with a vertical projection of the second pad structure, and an overall area of the vertical projections of the first pad structures is smaller than an area of the vertical projection of the second pad structure. The conductive terminal is disposed over and connects with the second pad structure.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation application of and claims thepriority benefit of a prior application Ser. No. 16/281,092, filed onFeb. 21, 2019. The entirety of the above-mentioned patent application ishereby incorporated by reference herein and made a part of thisspecification.

BACKGROUND

Semiconductor devices and integrated circuits used in a variety ofelectronic apparatus, such as cell phones and other mobile electronicequipment, are typically manufactured on a single semiconductor wafer.The dies of the wafer may be processed and packaged with othersemiconductor devices or dies at the wafer level, and varioustechnologies have been developed for the wafer level packaging. How toensure the reliability of the wafer level packaging has become achallenge in the field.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1A to FIG. 1P are schematic cross-sectional views illustratingprocess steps of manufacturing a semiconductor package in accordancewith some embodiments.

FIG. 2A, FIG. 2B and FIG. 2C are schematic top views illustratingportions of various redistribution conductive layers in the connectionstructure in accordance with some embodiments.

FIG. 3 is a schematic cross-sectional view illustrating a connectionstructure in accordance with some embodiments.

FIG. 4A, FIG. 4B and FIG. 4C are schematic top views illustratingportions of various redistribution conductive layers in the connectionstructure in accordance with some embodiments.

FIG. 5 is a schematic cross-sectional view illustrating a connectionstructure in accordance with some embodiments.

FIG. 6A, FIG. 6B and FIG. 6C are schematic top views illustratingportions of various redistribution conductive layers in the connectionstructure in accordance with some embodiments.

FIG. 7 is a schematic cross-sectional view illustrating a connectionstructure in accordance with some embodiments.

FIG. 8 is a schematic cross-sectional view illustrating a connectionstructure in accordance with some embodiments.

FIG. 9 is a schematic cross-sectional view illustrating a connectionstructure in accordance with some embodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Other features and processes may also be included. For example, testingstructures may be included to aid in the verification testing of the 3Dpackaging or 3DIC devices. The testing structures may include, forexample, test pads formed in a redistribution layer or on a substratethat allows the testing of the 3D packaging or 3DIC, the use of probesand/or probe cards, and the like. The verification testing may beperformed on intermediate structures as well as the final structure.Additionally, the structures and methods disclosed herein may be used inconjunction with testing methodologies that incorporate intermediateverification of known good dies to increase the yield and decreasecosts.

FIG. 1A to FIG. 1P are schematic cross-sectional views illustratingprocess steps of manufacturing a semiconductor package in accordancewith some embodiments.

Referring to FIG. 1A, a wafer 100 including a plurality of semiconductordies or integrated circuit components 200 arranged in an array isprovided. Before a wafer dicing process is performed on the wafer 100,the semiconductor dies 200 of the wafer 100 are connected one another.In some embodiments, the wafer 100 may include a semiconductor substrate110, a plurality of conductive pads 120 formed on the semiconductorsubstrate 110, and a passivation layer 130. The passivation layer 130 isformed over the semiconductor substrate 110 and has a plurality ofcontact openings 132 such that the conductive pads 120 are partiallyrevealed by the contact openings 132 of the passivation layer 130. Forexample, the semiconductor substrate 110 may be a silicon substrateincluding active components (e.g., transistors or the like) and passivecomponents (e.g., resistors, capacitors, inductors or the like) formedtherein; the conductive pads 120 may be aluminum pads, copper pads orother suitable metal pads; and the passivation layer 130 may be asilicon oxide layer, a silicon nitride layer, a silicon oxy-nitridelayer or a dielectric layer formed by other suitable dielectricmaterials.

As shown in FIG. 1A, in some embodiments, the wafer 100 may furtherinclude a post-passivation layer 140 formed on the passivation layer130. The post-passivation layer 140 covers the passivation layer 130 andhas a plurality of contact openings 142. The conductive pads 120revealed by the contact openings 132 of the passivation 130 arepartially revealed by the contact openings 142 of the post passivationlayer 140. For example, the post-passivation layer 140 may be apolyimide (PI) layer, a polybenzoxazole (PBO) layer, or a dielectriclayer formed by other suitable polymers. The passivation layer 130 andthe post passivation layer 140 may be regarded as a compositepassivation layer. Alternatively, the composite passivation layer may bereplaced by a single passivation layer.

Referring to FIG. 1B, a plurality of conductive pillars 150 are formedon the conductive pads 120. In some embodiments, the conductive pillars150 are plated on the conductive pads 120. The plating process ofconductive pillars 150 is described in detail as followings. First, aseed layer may be sputtered onto the post-passivation layer 140 and theconductive pads 120 revealed by the contact openings 142. A patternedphotoresist layer (not shown) may be then formed over the seed layer byphotolithography, wherein the patterned photoresist layer revealsportions of the seed layer that are corresponding to the conductive pads120. The wafer 100 including the patterned photoresist layer formedthereon may be immersed into a plating solution in a plating bath suchthat the conductive pillars 150 are plated on the portions of the seedlayer that are corresponding to the conductive pads 120. After formingthe plated conductive pillars 150, the patterned photoresist layer isstripped. Thereafter, by using the conductive pillars 150 as a hardmask, portions of the seed layer that are not covered by the conductivepillars 150 may be removed through etching until the post passivationlayer 140 is revealed, for example. In some embodiments, the platedconductive pillars 150 may be plated copper pillars.

Referring to FIG. 1C, after the conductive pillars 150 are formed, aprotection layer 160 is formed on the post passivation layer 140 so asto cover the conductive pillars 150. In some embodiments, the protectionlayer 160 may be a polymer layer having sufficient thickness toencapsulate and protect the conductive pillars 150. For example, theprotection layer 160 may be a polybenzoxazole (PBO) layer, a polyimide(PI) layer or other suitable polymers. In some alternative embodiments,the protection layer 160 may be made of inorganic materials.

Referring to FIG. 1C and FIG. 1D, a back-side grinding process isperformed on the back surface of the wafer 100 after forming theprotection layer 160. During the back-side grinding process, thesemiconductor substrate 110 is ground by a grinding wheel such that athinned wafer 100′ including a thinned semiconductor substrate 110′, theconductive pads 120 formed on the semiconductor substrate 110′, thepassivation layer 130, the post passivation layer 140, the conductivepillars 150 and the protection layer 160 is formed.

Referring to FIG. 1E, after performing the back-side grinding process, adicing tape DT including an adhesive layer 170 is provided and thethinned wafer 100′ is mounted on the adhesive layer 170 carried by thedicing tape DT such that the back surface of the thinned semiconductorsubstrate 110′ is adhered with the adhesive layer 170 on the dicing tapeDT. In some embodiments, the dicing tape DT may support the thinnedwafer 100′ mounted thereon and the adhesive layer 170 may temporarilyadhere with the back surface of the thinned wafer 100′. In someembodiments, the dicing tape DT may include PVC, polyolefin,polyethylene, or other suitable materials. Furthermore, the adhesivelayer 170 may include a liquid-type die attach film (DAF) or aliquid-type film over wire (FOW).

Referring to FIG. 1E and FIG. 1F, after mounting the thinned wafer 100′on the dicing tape DT, a wafer dicing process is performed on thethinned wafer 100′ such that the semiconductor dies 200 in the thinnedwafer 100′ are singulated from one another. In some embodiments, thewafer dicing process may be performed to cut through the thinned wafer100′, the adhesive layer 170 and cut into the dicing tape DT. After thesingulation process, a plurality of semiconductor dies 200 and aplurality of adhesive layers 170 a are formed. As shown in FIG. 1F, eachof the semiconductor dies 200 includes a semiconductor substrate 110 a,the conductive pads 120 formed on the semiconductor substrate 110 a, apassivation layer 130 a, a post passivation layer 140 a, the conductivepillars 150, and a protection layer 160 a. In some embodiments, theadhesive layers 170 a are adhered to the back surfaces of thesemiconductor substrates 110 a. The materials and the characteristics ofthe semiconductor substrate 110 a, the passivation layer 130 a, the postpassivation layer 140 a, and the protection layer 160 a are the same asthose of the semiconductor substrate 100, the passivation layer 130, thepost passivation layer 140, and the protection layer 160. Thus, thedetailed descriptions of the semiconductor substrate 110 a, thepassivation layer 130 a, the post passivation layer 140 a, and theprotection layer 160 a in the semiconductor dies 200 are omitted.

During the back-side grinding and the wafer dicing processes, theprotection layer 160 may well protect the conductive pillars 150. Inaddition, the protection layer 160 a may well protect the conductivepillars 150 of the semiconductor dies 200 from being damaged bysubsequently performed processes, such as the picking-up and placingprocess of the semiconductor dies 200, the molding process, and so on.

Referring to FIG. 1F and FIG. 1G, a carrier C having a de-bonding layerDB formed thereon is provided. In some embodiments, the carrier C is aglass substrate and the de-bonding layer DB includes a light-to-heatconversion (LTHC) release layer formed on the glass substrate. In somealternative embodiments, a dielectric layer (not shown) may be formed onthe de-bonding layer DB such that the de-bonding layer DB is between thecarrier C and the dielectric layer. In some embodiments, the dielectriclayer includes a buffer layer and the material of the buffer layerincludes polyimide (PI), polybenzoxazole (PBO), benzocyclobutene (BCB),or any other suitable polymer-based dielectric material. In someembodiments, the buffer layer may be an Ajinomoto Buildup Film (ABF), asolder resist film, or the like.

As shown in FIG. 1F and FIG. 1G, in some embodiments, at least onesemiconductor die 200 is picked-up from the dicing tape DT and placed onthe de-bonding layer DB of the carrier C. In some embodiments, thesemiconductor die 200 is adhered to the carrier C through the adhesivelayer 170 a. In alternative embodiments, the semiconductor die 200 isadhered to the de-bonding layer DB without the adhesive layer 170 a. Insome alternative embodiments, more than one of the semiconductor dies200 are picked-up from the dicing tape DT and placed on the de-bondinglayer DB, wherein the semiconductor dies 200 placed on the de-bondinglayer DB may be arranged in an array.

Referring to FIG. 1H, an insulating material 210 is formed on thede-bonding layer DB to cover the semiconductor die 200. In someembodiments, the insulating material 210 is a molding compound formed bya molding process. As shown in FIG. 1 H, the protection layer 160 a ofthe semiconductor die 200 is covered by the insulating material 210. Inother words, the protection layer 160 a of the semiconductor die 200 isnot revealed and is well protected by the insulating material 210. Insome embodiments, the insulating material 210 includes epoxy resins orother suitable resin materials.

Referring to FIG. 1I, a planarization process is performed to remove theinsulating material 210 and the protection layer 160 a until topsurfaces 150 t of the conductive pillars 150 are exposed. In someembodiments, the planarization process is performed by performing amechanical grinding process and/or a chemical mechanical polishing (CMP)process. After the insulating material 210 is polished or ground, aninsulating encapsulation 210′ is formed over the de-bonding layer DB tolaterally encapsulate the semiconductor die 200. During theplanarization process, not only the insulating material 210 is removed,a portion of the protection layer 160 a above the top surfaces 150 t ofthe conductive pillars 150 are also removed to form planarizedprotection layers 160 a′.

As shown in FIG. 1I, the insulating encapsulation 210′ wraps andsurrounds sidewalls of the semiconductor die 200. That is to say, thesemiconductor die 200 is laterally encapsulated by the insulatingencapsulant 210′. In other words, the semiconductor die 200 is embeddedin the insulating encapsulant 210′. It should be noted that, topsurfaces 150 t of the conductive pillars 150 and a top surface 160 t ofthe protection layer 160 a′ are substantially coplanar with a topsurface 210 t of the insulating encapsulant 210′.

Referring to FIG. 1J through FIG. 1L, after the insulating encapsulant210′ is formed, a redistribution circuit structure RDL electricallyconnected to the conductive pillars 150 of the semiconductor die 200 isformed on the top surface 210 t of the insulating encapsulant 210′, thetop surfaces 150 t of the conductive pillars 150, and the top surface160 t of the protection layer 160 a′. The redistribution circuitstructure RDL is fabricated to electrically connect to one or moreconnectors underneath. Here, the afore-said connectors may be theconductive pillars 150 of the semiconductor die 200. The redistributioncircuit structure RDL is described in detail in the followingdiscussion.

The following descriptions are focused on a manufacturing method of theredistribution circuit structure RDL in accordance with FIG. 1J throughFIG. 1L.

Referring to FIG. 1J, a dielectric layer 220 is formed on the insulatingencapsulant 210′ and the semiconductor die 200. In some embodiments, thedielectric layer 220 may be formed of a polymeric material includingpolyimide, PBO or BCB. The dielectric layer 220 may be formed by asuitable fabrication technique such as spin-coating, lamination,deposition, or the like. Then, the dielectric layer 220 is patterned tohave a plurality of openings O1, such that the conductive pillars 150 ofthe semiconductor die 200 are partially revealed by the openings O1 ofthe dielectric layer 220. In some embodiments, the dielectric layer 220may be patterned by photolithography and etching processes.

As shown in FIG. 1J, after the dielectric layer 220 is formed, aredistribution conductive layer 230 is formed on the dielectric layer220 and covers the openings O1 of the dielectric layer 220. In someembodiments, a material of the redistribution conductive layer 230 mayinclude aluminum, titanium, copper, nickel, tungsten, and/or alloysthereof. The redistribution conductive layer 230 may be formed byforming a metal-containing layer by, for example, electroplating ordeposition, and then patterning through photolithography and etchingprocesses. In some embodiments, the redistribution conductive layer 230is electrically connected to the semiconductor die 200. In someembodiments, the redistribution conductive layer 230 includes aplurality of via V1 a, a plurality of vias V1 b, a plurality of padstructures P1, a plurality of conductive patterns M1, and a routing lineR1. In some embodiments, the vias V1 a and the vias V1 b are disposed onthe semiconductor die 200 and the vias V1 a and the vias V1 b physicallycontact the conductive pillars 150 of the semiconductor die 200. In someembodiments, the pad structures P1 are disposed on and contact the viasV1 a in a one-to-one way. However, in some alternative embodiments, thepad structures P1 are disposed on and contact the vias V1 a in aone-to-multiple way. In some embodiments, the conductive patterns M1contact and connect with the vias V1 b. In some embodiments, the routingline R1 is disposed over the vias V1 a (formed as a via group VG1 a) andthe vias V1 b and is located between the pad structures P1. In someembodiments, the pad structures P1, the conductive patterns M1 and therouting line R1 are located at the same level in the redistributionconductive layer 230. That is, in some embodiments, the pad structuresP1, the conductive patterns M1 and the routing line R1 are located atthe same virtual plane perpendicular to the thickness direction Z. Insome embodiments, the via group VG1 a, the vias V1 b, the pad structuresP1, the conductive patterns M1 and the routing line R1 are formed at thesame time in the same process step. For example, the formation of thevia group VG1 a, the vias V1 b, the pad structures P1, the conductivepatterns M1 and the routing line R1 includes forming a blanket copperseed layer, forming a mask pattern over the blanket copper seed layer,performing a plating process to form the vias V1 a, the vias V1 b, thepad structures P1, the conductive patterns M1 and the routing line R1,removing the mask pattern, and removing portions of the blanket copperseed layer not covered by the vias V1 a, the vias V1 b, the padstructures P1, the conductive patterns M1 and the routing line R1.However, in some alternative embodiments, the vias V1 a and the vias V1b are formed at the same time in one process step, but the padstructures P1, the conductive patterns M1 and the routing line R1 may beformed in another process step(s).

In some embodiments, the vias V1 a and the vias V1 b are formed to fillup the openings O1 of the dielectric layer 220 such that the vias V1 aand the vias V1 b physically contact the conductive pillars 150 of thesemiconductor die 200 partially revealed by the openings O1 of thedielectric layer 220. In some embodiments, each of the conductivepatterns M1 may include a narrow extension portion and a wide padportion, wherein the wide pad portion may function as a pad and connectwith the underlying via V1 b, and the narrow extension portion mayfunction as a routing line or a trace. In some embodiments, the routingline R1 may be a portion of the corresponding one of the conductivepatterns M1. However, in some alternative embodiments, the routing lineR1 may function independently for fan-out routing and is not part of theconductive patterns M1. In some embodiments, the pad structures P1 aredisposed above the semiconductor die 200 and are located within the spanof the semiconductor die 200, while the conductive patterns M1 aredisposed over the semiconductor die 200 and the insulating encapsulant210′. In some embodiments, the conductive patterns M1 extend beyond thespan of the semiconductor die 200 and extend over to be above theinsulating encapsulant 210′. In one embodiment, the conductive patternsM1 include fan-out routing lines.

Referring to FIG. 1K, a dielectric layer 240 is formed on the dielectriclayer 220 and the redistribution conductive layer 230. In someembodiments, the dielectric layer 240 may be formed of a polymericmaterial including polyimide, PBO or BCB. The dielectric layer 240 maybe formed by a suitable fabrication technique such as spin-coating,lamination, deposition, or the like. Then, the dielectric layer 240 ispatterned to have a plurality of openings O2 revealing portions of theredistribution conductive layer 230. In some embodiments, the padstructures P1 of the redistribution conductive layer 230 are partiallyrevealed by some of the openings O2 of the dielectric layer 240, and theconductive patterns M1 of the redistribution conductive layer 230 arepartially revealed by the other of the openings O2 of the dielectriclayer 240. In some embodiments, the dielectric layer 240 may bepatterned by photolithography and etching processes.

As shown in FIG. 1K, after the dielectric layer 240 is formed, aredistribution conductive layer 250 is formed on the dielectric layer240 and covers the openings O2 of the dielectric layer 240. In someembodiments, a material of the redistribution conductive layer 250 mayinclude aluminum, titanium, copper, nickel, tungsten, and/or alloysthereof. The redistribution conductive layer 250 may be formed byforming a metal-containing layer by, for example, electroplating ordeposition, and then patterning through photolithography and etchingprocesses. In some embodiments, the redistribution conductive layer 250is electrically connected to the redistribution conductive layer 230. Insome embodiments, the redistribution conductive layer 250 includes aplurality of vias V2 a, a plurality of vias V2 b, a plurality of padstructures P2, a plurality of conductive patterns M2, and a plurality ofrouting line R2. In some embodiments, the vias V2 a are disposed on andcontact the pad structures P1 in a one-to-one way, and the padstructures P2 are disposed on and contact the vias V2 a in a one-to-oneway. However, in some alternative embodiments, the vias V2 a aredisposed on and contact the pad structures P1 in a multiple-to-one way,and the pad structures P2 are disposed on and contact the vias V2 a in aone-to-multiple way. In some embodiments, the vias V2 b are disposedover and contact the conductive patterns M1, and the conductive patternsM2 are disposed on and contact the vias V2 b. In some embodiments, therouting lines R2 are disposed over the vias V2 a (formed as a via groupVG2 a) and the vias V2 b and is located between the pad structures P2.In some embodiments, the pad structures P2, the conductive patterns M2and the routing line R2 are located at the same level in theredistribution conductive layer 250. That is, in some embodiments, thepad structures P2, the conductive patterns M2 and the routing line R2are located at the same virtual plane perpendicular to the thicknessdirection Z. In some embodiments, the via group VG2 a, the vias V2 b,the pad structures P2, the conductive patterns M2 and the routing linesR2 are formed at the same time in the same process step. However, insome alternative embodiments, the vias V2 a and the vias V2 b are formedat the same time in the one process step, but the pad structures P2, theconductive patterns M2 and the routing lines R2 may be formed in anotherprocess step(s).

In some embodiments, the vias V2 a and the vias V2 b are formed to fillup the openings O2 of the dielectric layer 240 such that the vias V2 acontact the pad structures P1 partially revealed by the openings O2 ofthe dielectric layer 240, and the vias V2 b contact the conductivepatterns M1 partially revealed by the openings O2 of the dielectriclayer 240. In some embodiments, each of the conductive patterns M2 mayinclude a narrow extension portion and a wide pad portion, wherein thewide pad portion may function as a pad and connect with the underlyingvia V2 b, and the narrow extension portion may function as a routingline or a trace. In some embodiments, each of the routing lines R2 maybe a portion of the corresponding one of the conductive patterns M2.However, in some alternative embodiments, the routing lines R2 mayfunction independently for fan-out routing and are not part of theconductive patterns M2. In some embodiments, the pad structures P2 aredisposed above the semiconductor die 200 and are located within the spanof the semiconductor die 200, while the conductive patterns M2 aredisposed over the semiconductor die 200 and the insulating encapsulant210′. In some embodiments, the conductive patterns M2 extend beyond thespan of the semiconductor die 200 and extend over to be above theinsulating encapsulant 210′. In one embodiment, the conductive patternsM2 include fan-out routing lines.

Referring to FIG. 1L, a dielectric layer 260 is formed on the dielectriclayer 240 and the redistribution conductive layer 250. In someembodiments, the dielectric layer 260 may be formed of a polymericmaterial including polyimide, PBO or BCB. The dielectric layer 260 maybe formed by a suitable fabrication technique such as spin-coating,lamination, deposition, or the like. Then, the dielectric layer 260 ispatterned to have a plurality of openings O3 revealing portions of theredistribution conductive layer 250. In some embodiments, the padstructures P2 of the redistribution conductive layer 250 are partiallyrevealed by some of the openings O3 of the dielectric layer 260, and theconductive patterns M2 of the redistribution conductive layer 250 arepartially revealed by the other of the openings O3 of the dielectriclayer 260. In some embodiments, the dielectric layer 260 may bepatterned by photolithography and etching processes.

As shown in FIG. 1L, after the dielectric layer 260 is formed, aredistribution conductive layer 270 is formed on the dielectric layer260 and covers the openings O3 of the dielectric layer 260. In someembodiments, a material of the redistribution conductive layer 270 mayinclude aluminum, titanium, copper, nickel, tungsten, and/or alloysthereof. The redistribution conductive layer 270 may be formed byforming a metal-containing layer by, for example, electroplating ordeposition, and then patterning through photolithography and etchingprocesses. In some embodiments, the redistribution conductive layer 270is electrically connected to the redistribution conductive layer 250. Insome embodiments, the redistribution conductive layer 270 includes aplurality of vias V3 a, a plurality of vias V3 b, a pad structure P3,and a plurality of conductive patterns M3. In some embodiments, the viasV3 a are disposed on and contact the pad structures P2 in a one-to-oneway. However, in some alternative embodiments, the vias V3 a aredisposed on and contact the pad structures P2 in a multiple-to-one way.In some embodiments, the vias V3 b are disposed on and contact theconductive patterns M2. In some embodiments the pad structure P3 isdisposed on and contacts the vias V3 a. In some embodiments, theconductive patterns M3 are disposed on and contact the vias V3 b. Insome embodiments, the pad structure P3 and the conductive patterns M3are located at the same level in the redistribution conductive layer270. That is, in some embodiments, the pad structure P3 and theconductive patterns M3 are located at the same virtual planeperpendicular to the thickness direction Z. In some embodiments, thevias V3 a (formed as a via group VG3 a), the vias VG3 b, the padstructure P3 and the conductive patterns M3 are formed at the same timein the same process step. However, in some alternative embodiments, thevias V3 a and the vias V3 b are formed at the same time in one processstep, but the pad structure P3 and the conductive patterns M3 may beformed in another process step(s).

In some embodiments, the vias V3 a and the vias V3 b are formed to fillup the openings O3 of the dielectric layer 260 such that the vias V3 acontact the pad structures P2 partially revealed by the openings O3 ofthe dielectric layer 260, and the vias V3 b contact the conductivepatterns M2 partially revealed by the openings O3 of the dielectriclayer 260. In some embodiments, each of the conductive patterns M3 mayinclude a narrow extension portion and a wide pad portion, wherein thewide pad portion may function as a pad and connect with the underlyingvia V3 b, and the narrow extension portion may function as a routingline or a trace. In some embodiments, the pad structure P3 is disposedabove the semiconductor die 200 and are located within the span of thesemiconductor die 200, while the conductive patterns M3 are disposedover the insulating encapsulant 210′. In some embodiments, theconductive patterns M3 extend beyond the span of the semiconductor die200 and extend over to be above the insulating encapsulant 210′. In oneembodiment, the conductive patterns M3 include fan-out routing lines.

As shown in FIG. 1L, after the redistribution conductive layer 270 isformed, a dielectric layer 280 is formed on the dielectric layer 260 andthe redistribution conductive layer 270 to achieve the formation of theredistribution circuit structure RDL. In other words, the redistributioncircuit structure RDL may include a plurality of dielectric layers (i.e.the dielectric layers 220, 240, 260, and 280) and a plurality ofredistribution conductive layers (i.e. the redistribution conductivelayers 230, 250, and 270) stacked alternately. In some embodiments, thedielectric layer 280 may be formed of a polymeric material includingpolyimide, PBO or BCB. The dielectric layer 280 may be formed by asuitable fabrication technique such as spin-coating, lamination,deposition, or the like. In some embodiments, the dielectric layer 280may be referred to as a top passivation layer. Then, the dielectriclayer 280 is patterned to have a plurality of openings O4 revealingportions of the redistribution conductive layer 270. In someembodiments, the pad structure P3 of the redistribution conductive layer270 is partially revealed by one of the openings O4 of the dielectriclayer 280, and the conductive patterns M3 of the redistributionconductive layer 270 are partially revealed by the other of the openingsO4 of the dielectric layer 280. In some embodiments, the dielectriclayer 280 may be patterned by photolithography and etching processes.

Referring to FIG. 1M, after the dielectric layer 280 is formed, aplurality of conductive terminals 300 are formed on the redistributionconductive layer 270 and the dielectric layer 280, and a wafer levelpackaging structure 400 is obtained. In some embodiments, each of theconductive terminals 300 includes a conductive pillar 302 and aconductive bump 304 disposed on the conductive pillar 302. In someembodiments, the conductive terminals 300 are referred to as “controlledcollapse chip connection (C4) bumps.” In some embodiments, theconductive terminals 300 may be formed by the following steps. First, aseed layer (not shown) is formed over the dielectric layer 280. The seedlayer extends into the openings O4 of the dielectric layer 280 to be incontact with the redistribution conductive layer 270. The seed layer maybe formed through, for example, a sputtering process, a physical vapordeposition (PVD) process, or the like. In some embodiments, the seedlayer may include, for example, copper, titanium-copper alloy, or othersuitable choice of materials. Subsequently, a photoresist pattern layer(not shown) having a plurality of openings is formed over the seedlayer. The openings of the photoresist pattern layer expose the seedlayer located in the openings O4 of the dielectric layer 280 and exposeat least a portion of the seed layer located on the dielectric layer280. Thereafter, a conductive material (not shown) and a solder material(not shown) are sequentially deposited onto the exposed seed layer. Thatis, the conductive material and the solder material are located withinopenings of the photoresist pattern layer. In some embodiments, theconductive material and the solder material may be formed by a platingprocess. The plating process is, for example, electro-plating,electroless-plating, immersion plating, or the like. In someembodiments, the conductive material includes, for example, copper,copper alloys, or the like. After the conductive material and the soldermaterial are formed, the photoresist pattern layer is removed. Uponremoval of the photoresist pattern layer, portions of the seed layer,which are not covered by the conductive material and the soldermaterial, are exposed. In some embodiments, the photoresist patternlayer may be removed/stripped through, for example, etching, ashing, orother suitable removal processes. Then, the seed layer that is notcovered by the conductive material and the solder material is removed.The exposed portions of the seed layer may be removed through an etchingprocess. In some embodiments, the remaining seed layer and theconductive material constitute the conductive pillars 302. Thereafter, areflow process is performed on the solder material to transform thesolder material into the conductive bumps 304.

As shown in FIG. 1M, a plurality of vias V1 a, a plurality of vias V2 a,a plurality of vias V3 a, a plurality of pad structures P1, a pluralityof pad structures P2, and the pad structure P3 are connected to oneconductive terminal 300 to form a connection structure CS1, and one viaV1 b, one via V2 b, one via V3 b, one conductive pattern M1, oneconductive pattern M2, and one conductive pattern M3 are connected toone conductive terminal 300 to form a connection structure CS2. In someembodiments, as shown in FIG. 1M, the semiconductor die 200 iselectrically connected to one connection structure CS1 and twoconnection structures CS2, but the disclosure is not limited thereto. Insome alternative embodiments, the semiconductor die 200 may beelectrically connected to more than one connection structure CS1. Insome embodiments, the vertical projection of the connection structureCS1 falls within the span of the vertical projection of thesemiconductor die 200, while the vertical projection of the connectionstructure CS2 is partially overlapped with the vertical projection ofthe semiconductor die 200. That is, the connection structure CS1 islocated within the span of the semiconductor die 200, while theconnection structure CS2 is disposed on the semiconductor die 200 andthe insulating encapsulation 210′. In some embodiments, a verticalprojection of each of the vias V1 a, a vertical projection of each ofthe pad structures P1, a vertical projection of each of the vias V2 a, avertical projection of each of the pad structures P2, a verticalprojection of each of the vias V3 a, a vertical projection of the padstructure P3, and a vertical projection of the conductive terminal 300are within a vertical projection of the semiconductor die 200.

FIG. 2A illustrates a schematic top view of the pad structure P3, thepad structures P1, the vias V1 a of the via group VG1 a and the routingline R1. FIG. 2B illustrates a schematic top view of the pad structureP3, the pad structures P2, the vias V2 a of the via group VG2 a, and therouting lines R2. FIG. 2C illustrates a schematic top view of the padstructure P3 and the vias V3 a of the via group VG3 a. In someembodiments, FIG. 2A, FIG. 2B and FIG. 2C show schematic top views ofthe connection structure CS1 in FIG. 1O at different redistributionconductive layers, while the schematic cross-sectional view of theconnection structure CS1 in the previous embodiment may correspond toportions shown along cross-section line A-A′ of FIG. 2A, FIG. 2B andFIG. 2C. For illustration purposes, the dielectric layer(s) filledbetween the redistribution conductive layers or the connection structureCS1 are omitted or shown as being transparent, but it is understood thatthere is dielectric layer(s) filled between the routing lines and theconnection structure.

As shown in FIG. 2A, the locations of the pad structures P1 (fartheraway from the conductive terminal 300) correspond to the location of thepad structure P3 (closer to the conductive terminal 300). That is, fromthe top view and along the thickness direction Z in FIG. 1O, thevertical projection of each of pad structures P1 overlaps the verticalprojection of the pad structure P3. In some embodiments, the verticalprojection of each of pad structures P1 falls within the span of thevertical projection of the pad structure P3 or falls within the span ofthe pad structure P3. However, the disclosure is not limited thereto. Insome alternative embodiments, the vertical projection of at least one ofpad structures P1 may be partially located within the span of the padstructure P3, i.e. the vertical projection of the at least one of padstructures P1 may partially overlap the vertical projection of the padstructure P3, as long as the vertical projection of the correspondingvia V1 a falls within the span of the pad structure P3. In certainembodiments, in FIG. 2A, if considering the shape of the pad structureP3 being round, the pad structure P3 is a round pad with a span SA3 (maybe measured as the area), while the pad structure P1 is a round pad witha span SA1 but the span SA1 is relatively smaller than the span SA3. Asshown in FIG. 2A, an overall area of the vertical projections of all thepad structures P1 is smaller than an area of the vertical projection ofthe pad structure P3. Comparing with the single pad structure P3, fourseparate and smaller pad structures P1 are arranged with spacesthere-between, which spaces may be saved for the arrangement of routingline R1. With such configuration, more flexibility is provided for thedesign of the layout. As shown in FIG. 2A, a portion of the routing lineR1 is formed between the pad structures P1 and the routing line R1extends across the span of the pad structure P3 and extends around oneor more pad structures P1 so that a vertical projection of a portion ofthe routing line R1 overlaps with the vertical projection of the padstructure P3. That is, by arranging separate pad structures, the routingline R1 is allowed to be arranged between the pad structures P1 and topass through the space above the pad structure P3, and hence the routingcapacity of the connection structure CS1 is improved.

Although the shape of the pad structure P1 or the pad structure P3 isshown to be circular in FIG. 2A, the disclosure is not limited thereto.In some alternative embodiments, the shape of each of the pad structuresP1 or the pad structure P3 may be hexagonal, octagonal or any polygonalshape. Although four pad structures P1 are illustrated in FIG. 2A, thedisclosure is not limited thereto. In some alternative embodiments, thenumber of the pad structures P1 may be two, three, five or more. Thatis, the number of the pad structures P1 illustrated in FIG. 2A merelyserves as an exemplary illustration, and the number of the padstructures P1 may vary based on demand. Although one routing line R1 isillustrated in FIG. 2A, the disclosure is not limited thereto. That is,the number of the routing line R1 illustrated in FIG. 2A merely servesas an exemplary illustration, and the number of the routing line R1 mayvary based on demand.

As shown in FIG. 2B, the locations of the pad structures P2 (fartheraway from the conductive terminal 300) correspond to the location of thepad structure P3 (closer to the conductive terminal 300). That is, fromthe top view and along the thickness direction Z, the verticalprojection of each of pad structures P2 overlaps the vertical projection(shown in the solid line) of the pad structure P3. In some embodiments,the vertical projection of each of pad structures P2 falls within thespan of the vertical projection of the pad structure P3 or falls withinthe span of the pad structure P3. However, the disclosure is not limitedthereto. In some alternative embodiments, the vertical projection of atleast one of pad structures P2 may be partially located within the spanof the pad structure P3, i.e. the vertical projection of the at leastone of pad structures P2 may partially overlap the vertical projectionof the pad structure P3, as long as the vertical projection of thecorresponding via V2 a falls within the span of the pad structure P3. Incertain embodiments, in FIG. 2B, if considering the shape of the padstructure P3 being round, the pad structure P3 is a round pad with thespan SA3 (may be measured as the area), while the pad structure P2 is around pad with a span SA2 but the span SA2 is relatively smaller thanthe span SA3. As shown in FIG. 2B, an overall area of the verticalprojections of all the pad structures P2 is smaller than an area of thevertical projection of the pad structure P3. Comparing with the singlebigger pad structure P3, four separate and smaller pad structures P2 arearranged with spaces there-between, which spaces may be saved for thearrangement of routing lines R2. With such configuration, moreflexibility is provided for the design of the layout. As shown in FIG.2B, a portion of each routing line R2 is formed between the padstructures P2 and the routing line R2 extends across the span of the padstructure P3 and extends around one or more pad structures P2 so that avertical projection of a portion of each routing line R2 overlaps withthe vertical projection of the pad structure P3. That is, by arrangingseparate pad structures, the routing lines R2 are allowed to be arrangedbetween the pad structures P2 and to pass through the space above thepad structure P3, and hence the routing capacity of the connectionstructure CS1 is improved.

Although the shape of each of the pad structures P2 or the pad structureP3 is shown to be circular in FIG. 2B, the disclosure is not limitedthereto. In some alternative embodiments, the shape of each of the padstructures P2 or the pad structure P3 may be hexagonal, octagonal or anypolygonal shape. Although four pad structures P2 are illustrated in FIG.2B, the disclosure is not limited thereto. In some alternativeembodiments, the number of the pad structures P2 may be two, three, fiveor more. That is, the number of the pad structures P2 illustrated inFIG. 2B merely serves as an exemplary illustration, and the number ofthe pad structures P2 may vary based on demand. Although two routinglines R2 are illustrated in FIG. 2B, the disclosure is not limitedthereto. That is, the number of the routing lines R2 illustrated in FIG.2B merely serves as an exemplary illustration, and the number of therouting lines R2 may vary based on demand.

Referring to FIG. 1M, FIG. 2A, FIG. 2B and FIG. 2C, the vias V1 a of thevia group VG1 a are vertically aligned with the vias V2 a of the viagroup VG2 a, and the vias V2 a of the via group VG2 a are verticallyaligned with the vias V3 a of the via group VG3 a. That is, the vias V1a, V2 a and V3 a are vertically stacked and aligned with one another. Insome embodiments, the pad structures P1 are vertically aligned with thepad structures P2 (i.e. the vertical projections of the pad structuresP1 and P2 substantially overlap), and the vertical projections of thepad structures P1 and P2 fall within the span of the pad structure P3.Referring to FIG. 1M, FIG. 2A, FIG. 2B and FIG. 2C, the connectionstructure CS1 includes multiple vias V1 a respectively connected withmultiple pad structures P1, multiple vias V2 a respectively connectedwith multiple pad structures P2, and multiple vias V3 a connected withthe single pad structure P3. In some embodiments, when the connectionstructure CS1 functions as ground or power terminals, such configurationhas better connection reliability owing to the larger size of the padstructure P3 and the joining multiple vias and multiple pad structures.Multiple vias between the stacked pad structures help to distributelarge electrical current, thus avoiding possible breakage and improvesconnection reliability. In some embodiments, the reliability of theconnection structure CS1 is 1.1 times to 1.6 times of the reliability ofthe connection structure CS2.

Referring to FIG. 1N, the wafer-level packaging structure 400 is flipped(turned upside down) and attached or adhered onto a dicing tape DT2. Insome embodiments, the dicing tape DT2 may include PVC, polyolefin,polyethylene, or other suitable materials as long as the material isable to hold the above-mentioned structures.

Referring to FIG. 1O, a de-bonding process is performed such that thecarrier C is de-bonded and removed from the wafer-level packagingstructure 400. In some embodiments, the de-bonding layer DB may beirradiated by an UV laser such that the carrier C and the de-bondinglayer DB may be peeled off from the wafer-level packaging structure 400.However, the de-bonding process is not limited thereto. Other suitablede-carrier methods may be used in some alternative embodiments.

Still referring to FIG. 1O, a dicing process is performed along thedicing lines DL to cut the wafer-level packaging structure 400 (cuttingthrough the insulating encapsulant 210′, and redistribution circuitstructure RDL) into an individual package 40 (as shown in FIG. 1P). Insome alternative embodiments, when the wafer-level packaging structure400 includes more than one of the semiconductor dies 200, after thedicing process is performed, a plurality of individual packages 40 areformed. In some embodiments, the dicing process may include a mechanicalblade sawing process, laser cutting process, or other suitableprocesses.

Referring to FIG. 1P, the package 40 may include the semiconductor die200 adhered to the adhesive layer 170 a and laterally encapsulated bythe insulating encapsulant 210′, the redistribution circuit structureRDL formed on the semiconductor die 200 and electrically connected tothe semiconductor die 200, and the conductive terminals 300, wherein theredistribution circuit structure RDL includes the plurality ofdielectric layers 220, 240, 260, and 280 and the plurality of theredistribution conductive layers 230, 250, and 270 stacked alternately.In one embodiment, the package 40 is an integrated fan-out (InFO)package. As shown in 1P, the package 40 is mounted on a substrate 1100through the conductive bumps 304 of the conductive terminals 300 toobtain the package structure 10. That is, the conductive bumps 304 ofthe connection structure CS1 and the connection structures CS2 shown inFIG. 1M, FIG. 1N, or FIG. 1O are in the form before the reflow process,and the conductive bumps 304 of the connection structure CS1 and theconnection structures CS2 shown in FIG. 1P are in the form after thereflow process for connection between the package 40 and the substrate1100. In some embodiments, the substrate 1100 may include a printedcircuit board (PCB) or the like.

As shown in FIG. 1O, FIG. 2A, FIG. 2B and FIG. 2C, in connectionstructure CS1, the vias V1 a are vertically aligned with the vias V2 a,and the vias V2 a are vertically aligned with the vias V3 a. However,the disclosure is not limited thereto. In some alternative embodiments,the vias V1 a may be vertically misaligned with the vias V2 a, and thevias V2 a may be vertically misaligned with the vias V3 a. The detailswill be described below with reference to FIG. 3, FIG. 4A to FIG. 4C.

FIG. 3 is a schematic cross-sectional view illustrating a connectionstructure CS3 in accordance with some embodiments. FIG. 4A illustrates aschematic top view of the pad structure P3, the pad structures P1 andthe vias V1 a of the via group VG1 a of the connection structure CS3.FIG. 4B illustrates a schematic top view of the pad structure P3, thepad structures P2 and the vias V2 a of the via group VG2 a of theconnection structure CS3. FIG. 4C illustrates a schematic top view ofthe pad structure P3 and the vias V3 a of the via group VG3 a of theconnection structure CS3. In some embodiments, FIG. 4A, FIG. 4B and FIG.4C show schematic top views of the connection structure CS3 in FIG. 3 atdifferent redistribution conductive layers, while the schematiccross-sectional view of the connection structure CS3 in FIG. 3 maycorrespond to portions shown along cross-section line B-B′ of FIG. 4A,FIG. 4B and FIG. 4C. For illustration purposes, the dielectric layer(s)filled between the redistribution conductive layers or the connectionstructure CS3 are omitted or shown as being transparent, but it isunderstood that there is dielectric layer(s) filled in the connectionstructure. The elements similar to or substantially the same as theelements described previously will use the same reference numbers, andcertain details or descriptions (e.g. the relative configurations orelectrical connections, and the formations and materials) of the sameelements may not be repeated herein.

As shown in FIG. 3, FIG. 4A and FIG. 4B, in connection structure CS3,the vias V1 a are staggered with the vias V2 a. As shown in FIG. 3, FIG.4B and FIG. 4C, in connection structure CS3, the vias V2 a are staggeredwith the vias V3 a.

In addition, as shown in FIG. 2A and FIG. 2B, in connection structureCS1, with respect to a virtual axis CA along the thickness direction Zat the central point of the pad structure P3 being round shape, the padstructures P1 located at the virtual plane perpendicular to thethickness direction Z are symmetrically arranged with each other, andthe pad structures P2 located at the virtual plane perpendicular to thethickness direction Z are symmetrically arranged with each other, whileas shown in FIG. 4A and FIG. 4B, in connection structure CS3, withrespect to a virtual axis CA along the thickness direction Z at thecentral point of the pad structure P3 being round shape, the padstructures P1 located at the virtual plane perpendicular to thethickness direction Z are asymmetrically arranged with each other, andthe pad structures P2 located at the virtual plane perpendicular to thethickness direction Z are asymmetrically arranged with each other. Assuch, it should be noted that the arrangements of the pad structures P1and the pad structures P2 shown in FIG. 2A to FIG. 2B and FIG. 4A toFIG. 4B merely serve as an exemplary illustration, and the arrangementsof the pad structures P1 and the pad structures P2 may be varied basedon demand.

As shown in FIG. 1O, FIG. 2A, FIG. 2B and FIG. 2C, in the connectionstructure CS1, the via group VG1 a contacting the pad structures P1includes more than one via V1 a, and the via group VG2 a contacting thepad structures P2 includes more than one via V2 a. However, thedisclosure is not limited thereto. In some alternative embodiments, inthe connection structure of the disclosure, the via group VG1 a may haveone via V1 a and contacts one pad structure P1, and the via group VG2 amay have one via V2 a. The details will be described below withreference to FIG. 5, FIG. 6A to FIG. 6C.

FIG. 5 is a schematic cross-sectional view illustrating a connectionstructure CS4 in accordance with some embodiments. FIG. 6A illustrates aschematic top view of the pad structure P3, the pad structure P1 and thevia V1 a of the via group VG1 a of the connection structure CS4. FIG. 6Billustrates a schematic top view of the pad structure P3, the padstructures P2 and the via V2 a of the via group VG2 a of the connectionstructure CS4. FIG. 6C illustrates a schematic top view of the padstructure P3 and the vias V3 a of the via group VG3 a of the connectionstructure CS4. In some embodiments, FIG. 6A, FIG. 6B and FIG. 6C showschematic top views of the connection structure CS4 in FIG. 5 atdifferent redistribution conductive layers, while the schematiccross-sectional view of the connection structure CS4 in FIG. 5 maycorrespond to portions shown along cross-section line C-C′ of FIG. 6A,FIG. 6B and FIG. 6C. For illustration purposes, the dielectric layer(s)filled between the redistribution conductive layers or the connectionstructure CS4 are omitted or shown as being transparent, but it isunderstood that there is dielectric layer(s) filled in the connectionstructure. The elements similar to or substantially the same as theelements described previously will use the same reference numbers, andcertain details or descriptions (e.g. the relative configurations orelectrical connections, and the formations and materials) of the sameelements may not be repeated herein.

As shown in FIG. 5, FIG. 6A and FIG. 6B, in the connection structureCS4, the via V1 a of the via group VG1 a and the via V2 a of the viagroup VG2 a contact the same pad structure P1. That is, the connectionstructure CS4 has one via V1 a, one pad structure P1 and one via V2 a.Since the connection structure CS4 has one pad structure P1, a lot ofspaces may be saved above the pad structure P3 for the arrangement ofrouting line(s). As such, more flexibility is provided for the design ofthe layout and the routing capacity of the connection structure CS4 isimproved.

As shown in FIG. 5, FIG. 6B and FIG. 6C, in the connection structureCS4, the via group VG3 a is divided into a via group VG3 a 1 and a viagroup VG3 a 2, wherein one of the pad structures P2 contacts andconnects with the via V3 a of the via group VG3 a 1 in a one-to-one way,and the rest three of the pad structures P2 contact and connect with thevias V3 a of the via group VG3 a 2 in a one-to-multiple way. Althoughone pad structure P2 is shown to contact and connect with two vias V3 aof the via group VG3 a 2 in FIG. 5, FIG. 6B and FIG. 6C, the disclosureis not limited thereto. In some alternative embodiments, one padstructure P2 may contact and connect with three, five or more vias V3 aof the via group VG3 a 2. With such configuration, the number of thevias V3 a of the connection structure CS4 connecting between the padstructures P2 and the pad structure P3 is more than the number of thevia V3 b of the connection structure CS2 connecting between theconductive pattern M2 and the conductive pattern M3, therefore thereliability of the connection structure CS4 is improved. In someembodiments, the reliability of the connection structure CS4 is 1.1times to 1.6 times of the reliability of the connection structure CS2.In some embodiments, in the connection structure CS4, the via V3 a ofthe via group VG3 a 1 and the via V2 a of the via group VG2 a contactthe same pad structure P2, and the vias V3 a of the via group VG3 a 2contact the pad structures P2 that do not contact the via group VG2 a.In some embodiments, in the connection structure CS4, the via V3 a ofthe via group VG3 a 1 vertically overlaps with the via V2 a of the viagroup VG2 a, while the vias V3 a of the via group VG3 a 2 do notvertically overlap with the via V2 a of the via group VG2 a.

FIG. 7 is a schematic cross-sectional view illustrating a connectionstructure CS5 in accordance with some embodiments. Referring to FIG. 7and FIG. 5, the connection structure CS5 illustrated in FIG. 7 issimilar to the connection structure CS4 illustrated in FIG. 5, exceptthe difference therebetween lies mainly in the configuration of the viagroup VG1 a, the via group VG2 a and the via group VG3 a 1. Forillustration purposes, the dielectric layer(s) filled between theredistribution conductive layers or the connection structure CS5 areomitted or shown as being transparent, but it is understood that thereis dielectric layer(s) filled in the connection structure. The elementssimilar to or substantially the same as the elements describedpreviously will use the same reference numbers, and certain details ordescriptions (e.g. the relative configurations or electricalconnections, and the formations and materials) of the same elements maynot be repeated herein.

Referring to FIG. 7 and FIG. 5, in the connection structure CS5 of FIG.7, the via V1 a of the via group VG1 a is staggered with the via V2 a ofthe via group VG2 a, and the via V2 a of the via group VG2 a isstaggered with the via V3 a of the via group VG3 a 1; while in theconnection structure CS4 of FIG. 5, the via V1 a of the via group VG1 ais vertically aligned with the via V2 a of the via group VG2 a, and thevia V2 a of the via group VG2 a is vertically aligned with the via V3 aof the via group VG3 a 1. That is, in the connection structure CS5 ofFIG. 7, the via V1 a of the via group VG1 a is vertically misalignedwith the via V2 a of via group VG2 a, and the via V2 a of via group VG2a is vertically misaligned with the via V3 a of the via group VG3 a 1.

FIG. 8 is a schematic cross-sectional view illustrating a connectionstructure CS6 in accordance with some embodiments. Referring to FIG. 8and FIG. 1O, the connection structure CS5 illustrated in FIG. 7 issimilar to the connection structure CS1 illustrated in FIG. 1O, exceptthe difference therebetween lies mainly in the configuration of the viagroup VG2 a and the via group VG3 a. For illustration purposes, thedielectric layer(s) filled between the redistribution conductive layersor the connection structure CS6 are omitted or shown as beingtransparent, but it is understood that there is dielectric layer(s)filled in the connection structure. The elements similar to orsubstantially the same as the elements described previously will use thesame reference numbers, and certain details or descriptions (e.g. therelative configurations or electrical connections, and the formationsand materials) of the same elements may not be repeated herein.

Referring to FIG. 8, in the connection structure CS6, one of the padstructures P2 contacts and connects with the vias V2 a of the via groupVG2 a in a one-to-multiple way, while another one of the pad structuresP2 contacts and connects with the via V2 a of the via group VG2 a in aone-to-one way. Although one pad structure P2 is shown to contact andconnect with two vias V2 a of the via group VG2 a in FIG. 7, thedisclosure is not limited thereto. In some alternative embodiments, onepad structure P2 may contact and connect with three, five or more viasV2 a of the via group VG2 a. With such configuration, the reliability ofthe connection structure CS6 is improved, due to the increasing numberof the vias V2 a connecting between the pad structures P2 and the padstructure P3. Although one pad structure P2 is shown to contact andconnect with the vias V2 a of the via group VG2 a in a one-to-multipleway in FIG. 7, the disclosure is not limited thereto. In somealternative embodiments, one pad structure P2 may contact and connectwith the vias V3 a of the via group VG3 a in a one-to-multiple wayand/or one pad structure P1 may contact and connect with the vias V1 aof the via group VG1 a in a one-to-multiple way.

In addition, referring to FIG. 8, in the connection structure CS6, thesize of one of the vias V3 a is greater than the size of another one ofthe vias V3 a. That is, in the connection structure CS6, the contactingarea between one of the vias V3 a and the corresponding pad structure P2is greater than the contacting area between another one of the vias V3 aand the corresponding pad structure P2. With such configuration, thereliability of the connection structure CS6 is improved, due to theincreasing contacting area between the vias V3 a and the pad structuresP2. In some embodiments, in the connection structure CS6, the contactingarea between one of the vias V3 a and the corresponding pad structure P2is 1 times to 4 times of the contacting area between another one of thevias V3 a and the corresponding pad structure P2. In some embodiments,the reliability of the connection structure CS6 is 1.1 times to 1.6times of the reliability of the connection structure CS2. Although thevias V3 a of the via group VG3 a is shown to have different sizes inFIG. 8, the disclosure is not limited thereto. In some alternativeembodiments, the vias V1 a of the via group VG1 a may have differentsizes and/or the vias V2 a of the via group VG2 a may have differentsizes.

FIG. 9 is a schematic cross-sectional view illustrating a connectionstructure CS7 in accordance with some embodiments. Referring to FIG. 9and FIG. 8, the connection structure CS7 illustrated in FIG. 9 issimilar to the connection structure CS6 illustrated in FIG. 8, exceptthe difference therebetween lies mainly in the configuration of the viagroup VG1 a, the via group VG2 a and the via group VG3 a. Forillustration purposes, the dielectric layer(s) filled between theredistribution conductive layers or the connection structure CS7 areomitted or shown as being transparent, but it is understood that thereis dielectric layer(s) filled in the connection structure. The elementssimilar to or substantially the same as the elements describedpreviously will use the same reference numbers, and certain details ordescriptions (e.g. the relative configurations or electricalconnections, and the formations and materials) of the same elements maynot be repeated herein.

Referring to FIG. 9 and FIG. 8, in the connection structure CS7 of FIG.9, the via V1 a is staggered with the via V2 a contacting the same padstructure P1 as the said via V1 a, and the via V2 a is staggered withthe via V3 a which contacting the same pad structure P2 as the said viaV2 a; while in the connection structure CS6 of FIG. 8, the via V1 a isvertically aligned with the via V2 a which contacting the same padstructure P1 as the said via V1 a, and the via V2 a is verticallyaligned with the via V3 a which contacting the same pad structure P2 asthe said via V2 a. That is, in the connection structure CS7 of FIG. 9,the via V1 a is vertically misaligned with the via V2 a which contactingthe same pad structure P1 as the said via V1 a, and the via V2 a isvertically misaligned with the via V3 a which contacting the same padstructure P2 as the said via V2 a.

In accordance with some embodiments of the disclosure, a semiconductorpackage includes a semiconductor die and a connection structure. Thesemiconductor die is laterally encapsulated by an insulatingencapsulant. The connection structure is disposed on the semiconductordie, the connection structure is electrically connected to thesemiconductor die, and the connection structure includes at least onefirst via, first pad structures, second vias, a second pad structure anda conductive terminal. The at least one first via is disposed over andelectrically connected to the semiconductor die. The first padstructures are disposed over the at least one first via, wherein the atleast one first via contacts at least one of the first pad structures.The second vias are disposed over the first pad structures, wherein thesecond vias contact the first pad structures. The second pad structureis disposed over and contacts the second vias, wherein a verticalprojection of each of first pad structures overlaps with a verticalprojection of the second pad structure, and an overall area of thevertical projections of the first pad structures is smaller than an areaof the vertical projection of the second pad structure. The conductiveterminal is disposed over and connects with the second pad structure.

In accordance with some embodiments of the disclosure, a semiconductorpackage includes a semiconductor die, an encapsulant, a conductiveterminal, and a redistribution circuit structure. The encapsulantencapsulates the semiconductor die therein. The conductive terminal isdisposed over the semiconductor die. The redistribution circuitstructure is disposed between the semiconductor die and the conductiveterminal and has conductive layers therein, wherein the redistributioncircuit structure includes first vias, first pad structures, secondvias, a second pad structure, and at least one first routing line. Thefirst vias are disposed on the semiconductor die and electricallyconnected to the semiconductor die. The first pad structures aredisposed on and contact the first vias. The second vias are disposed onand contact the first pad structures. The second pad structure isdisposed on and contacts the second vias, wherein a vertical projectionof each of the first vias and a vertical projection of each of thesecond vias are located within a span of a vertical projection of thesecond pad structure. The at least one routing line is disposed underthe second pad structure, wherein the at least one routing line islocated between the first pad structures, and the at least one routingline and the first pad structures are located in a same conductivelayer.

In accordance with some embodiments of the disclosure, a method ofmanufacturing a semiconductor package includes at least the followingsteps. A semiconductor die having conductive pillars is provided over acarrier. The semiconductor die is laterally encapsulated with aninsulating encapsulant. First vias are formed on the conductive pillars,wherein the first vias are electrically connected to the conductivepillars. First pad structures are formed on the first vias, wherein thefirst pad structures respectively contact the first vias. Second viasare formed on the first pad structures, wherein the second vias contactthe first pad structures. Second pad structures are formed on the secondvias and at least one routing line is formed between the second padstructures, wherein the second pad structures are vertically alignedwith the first pad structures. Third vias are formed on the second padstructures, wherein the third vias contact the second pad structures. Athird pad structure is formed on the third vias and covers the secondpad structures, the first pad structures and a portion of the at leastone routing line, wherein the third pad structure contacts the thirdvias, and a span of the third pad structure overlaps a span of each offirst pad structures and a span of each of second pad structures. Aconductive terminal is formed on the third pad structure, wherein theconductive terminal connects with the third pad structure and iselectrically connected with the semiconductor die.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A semiconductor package, comprising: asemiconductor die; and a connection structure disposed on thesemiconductor die, the connection structure being electrically connectedto the semiconductor die, and the connection structure comprising: firstpad structures; a second pad structure electrically connected to thefirst pad structures, wherein a vertical projection of each of the firstpad structures overlaps with a vertical projection of the second padstructure, and an overall area of the vertical projections of the firstpad structures is smaller than an area of the vertical projection of thesecond pad structure; and a conductive terminal electrically connectedto the second pad structure, wherein the first pad structures aredisposed between the second pad structure and the semiconductor die, thesecond pad structure is disposed between the conductive terminal and thefirst pad structures.
 2. The semiconductor package according to claim 1,wherein the connection structure further comprises: at least one firstvia disposed between the first pad structures and the semiconductor die,and electrically connected to the first pad structures; and second viasdisposed between and electrically connected to the first pad structuresand the second pad structure.
 3. The semiconductor package according toclaim 2, wherein the at least one first via and one of the second viasare connected to two opposite sides of the at least one of the first padstructures, wherein the one of the second vias is vertically alignedwith the at least one first via.
 4. The semiconductor package accordingto claim 2, wherein the at least one first via and one of the secondvias are connected to two opposite sides of the at least one of thefirst pad structures, wherein the one of the second vias and the atleast one first via are vertically staggered.
 5. The semiconductorpackage according to claim 2, wherein the first pad structures contactthe second vias in a one-to-one way.
 6. The semiconductor packageaccording to claim 2, wherein the first pad structures contact thesecond vias in a one-to-multiple way.
 7. The semiconductor packageaccording to claim 2, wherein a size of one of the second vias isgreater than a size of another one of the second vias.
 8. Thesemiconductor package according to claim 2, wherein the at least onefirst via comprises first vias, the connection structure furthercomprises third pad structures disposed between the first vias and thesemiconductor die, wherein a vertical projection of each of the thirdpad structures overlaps with the vertical projection of the second padstructure, and an overall area of the vertical projections of the thirdpad structures is smaller than the area of the vertical projection ofthe second pad structure.
 9. The semiconductor package according toclaim 1, further comprising at least one routing line located at thesame level with the first pad structures, wherein a vertical projectionof the at least one routing line at least partially overlaps with thevertical projection of the second pad structure.
 10. A semiconductorpackage, comprising: a semiconductor die; a conductive terminal disposedover the semiconductor die; and a redistribution circuit structuredisposed between the semiconductor die and the conductive terminal andhaving conductive layers therein, wherein the redistribution circuitstructure comprises: first vias electrically connected with thesemiconductor die and the conductive terminal; first pad structuresdisposed closer to the conductive terminal than the first vias in athickness direction and electrically connected to the first vias; secondvias disposed closer to the conductive terminal than the first padstructures in the thickness direction and electrically connected to thefirst pad structures; a second pad structure disposed closer to theconductive terminal than the second vias in the thickness direction andelectrically connected to the second vias, wherein a vertical projectionof each of the first vias and a vertical projection of each of thesecond vias are located within a span of a vertical projection of thesecond pad structure; and at least one routing line located between thefirst pad structures, and located in the same conductive layer as thefirst pad structures.
 11. The semiconductor package according to claim10, wherein the first pad structures contact the second vias in aone-to-one way.
 12. The semiconductor package according to claim 10,wherein the first pad structures contact the second vias in aone-to-multiple way.
 13. The semiconductor package according to claim10, wherein one of the first vias is vertically aligned with one of thesecond vias.
 14. The semiconductor package according to claim 10,wherein one of the first vias is vertically misaligned with one of thesecond vias.
 15. The semiconductor package according to claim 10,wherein a size of one of the second vias is greater than a size ofanother one of the second vias.
 16. The semiconductor package accordingto claim 10, wherein the redistribution circuit structure furthercomprises: third pad structures disposed closer to the semiconductor diethan the first pad structures; and third vias disposed closer to thesemiconductor die than the third pad structures, wherein a verticalprojection of each of the third vias is located within the span of thevertical projection of the second pad structure.
 17. The semiconductorpackage according to claim 16, wherein the third pad structures arevertically aligned with the first pad structures.
 18. A method ofmanufacturing a semiconductor package, comprising: providing asemiconductor die; forming first pad structures over the semiconductordie, wherein the first pad structures electrically connected to thesemiconductor die; forming second pad structures over the first padstructures and forming at least one routing line between the second padstructures, wherein the second pad structures are electrically connectedto the first pad structures; and forming a third pad structure over thesecond pad structures and a portion of the at least one routing line,wherein a span of the third pad structure overlaps a span of each offirst pad structures and a span of each of second pad structures, andthe third pad structure is electrically connected to the second padstructures.
 19. The method according to claim 18, further comprisingforming a conductive terminal on the third pad structure, wherein theconductive terminal connects with the third pad structure.
 20. Themethod according to claim 18, wherein forming second pad structures overthe first pad structures comprises forming the second pad structuresvertically aligned with the first pad structures.